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Band structure effects in interband tunnel devices

Conference · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
OSTI ID:7305783
; ;  [1]
  1. California Inst. of Tech., Pasadena (United States)
The authors report on a calculation of transport in InAs/GaSb/AlSb-based interband tunnel structures using a realistic band structure model. The results are compared with calculations using a two-band model which includes only the lowest conduction band and the light-hole band. They found that for device structures containing GaSb quantum wells, the inclusion of heavy-hole states can introduce additional transmission resonances and substantial hole-mixing effects. These effects are found to have a significant influence on the current-voltage characteristics of interband devices.
OSTI ID:
7305783
Report Number(s):
CONF-910115--
Conference Information:
Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Journal Volume: 9:4
Country of Publication:
United States
Language:
English