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Noise limitations of rf SQUIDS. Technical report

Technical Report ·
OSTI ID:7305319
A discussion is given of the noise sources and sensitivity limits of the rf biased SQUID. Both the low critical current inductive and the higher critical current hysteretic devices are considered. The intrinsic SQUID noise is treated by considering the internal flux response of a SQUID ring to an applied rf flux. While approximate, this approach yields the most direct picture of the nature of the intrinsic noise. Circuit optimization procedures for maximizing SQUID performance under various operating conditions are also outlined. Finally, the effects of non-ideal weak link behavior upon SQUID operation are treated.
Research Organization:
Cornell Univ., Ithaca, NY (USA)
OSTI ID:
7305319
Report Number(s):
AD-A-032722
Country of Publication:
United States
Language:
English

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Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CRITICAL CURRENT
CURRENTS
ELECTRIC CURRENTS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
FLUXMETERS
MEASURING INSTRUMENTS
MICROWAVE EQUIPMENT
NOISE
OPERATION
OPTIMIZATION
SQUID DEVICES
SUPERCONDUCTING DEVICES