Scanning tunneling microscopy tip-dependent image contrast of S/Pt(111) by controlled atom transfer

Journal Article · Sun May 01 00:00:00 EDT 1994 · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)

DOI:https://doi.org/10.1116/1.587591· OSTI ID:7303404

McIntyre, B J; Sautet, P; Dunphy, J C; Salmeron, M; Somorjai, G A ^[1]

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1. Center for Advanced Materials, Material Science Division, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)

Sudden changes in the detailed appearance and corrugation of atomic-resolution scanning tunneling microscopy (STM) images are commonly observed. In particular, these effects for the Pt(111)([radical]3[times][radical]3)[ital R]30[degree]-sulfur structure have been studied. Corrugation changes have been investigated by the controlled transfer of atoms between tip and sample. Theoretical image simulations using electron scattering quantum chemical methods show that the image contrast is strongly dependent on the chemical identity of the STM tip atom. Observed changes in the sulfur images can be explained by changes from platinum-terminated to sulfur-terminated STM tips.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 7303404
• Journal Information: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 12:3; ISSN JVTBD9; ISSN 0734-211X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
ADSORPTION
ATOM TRANSPORT
COMPUTERIZED SIMULATION
ELECTRONIC STRUCTURE
ELEMENTS
IMAGES
METALS
MICROSCOPY
NEUTRAL-PARTICLE TRANSPORT
NONMETALS
PLATINUM
PLATINUM METALS
RADIATION TRANSPORT
SIMULATION
SORPTION
SULFUR
SURFACE PROPERTIES
TRANSITION ELEMENTS