Strain relaxation by domain formation in epitaxial ferroelectric thin films

Journal Article · Mon Jun 22 00:00:00 EDT 1992 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.68.3733· OSTI ID:7294070

Kwak, B S; Erbil, A ^[1]; Wilkens, B J ^[2]; Budai, J D; Chisholm, M F; Boatner, L A ^[3]

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1. School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States)
2. Bell Communications Research, Red Bank, New Jersey 07701-7020 (United States)
3. Solid State Division, Oak Ridge National Laboratory Oak Ridge, Tennessee 37831 (United States)

The origin of strain-induced, modulated domain structures observed in epitaxial ferroelectric lead titanate thin films is discussed using a phenomenological total-energy calculation. Linear elasticity is used to account for the substrate contribution while a free-energy functional of the Landau-Ginzburg-Devonshire type is used to calculate the domain-wall and the polarization contributions from the film. Good agreement between the predictions of this model and the experimental results is found for thickness-dependent properties such as the relative domain population and spontaneous strain.

• DOE Contract Number: AC05-84OR21400
• OSTI ID: 7294070
• Journal Information: Physical Review Letters; (United States), Vol. 68:25; ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
LEAD COMPOUNDS
DOMAIN STRUCTURE
TITANATES
CHEMICAL VAPOR DEPOSITION
COMPARATIVE EVALUATIONS
CRYSTAL MODELS
ELASTICITY
EPITAXY
FERROELECTRIC MATERIALS
FREE ENERGY
MICROSTRUCTURE
PHASE TRANSFORMATIONS
STRAINS
STRESS RELAXATION
THICKNESS
THIN FILMS
CHEMICAL COATING
CRYSTAL STRUCTURE
DEPOSITION
DIMENSIONS
ENERGY
EVALUATION
FILMS
MATHEMATICAL MODELS
MECHANICAL PROPERTIES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
RELAXATION
SURFACE COATING
TENSILE PROPERTIES
THERMODYNAMIC PROPERTIES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
360202* - Ceramics
Cermets
& Refractories- Structure & Phase Studies