Orientational disorder in solvent-free solid C sub 70

Journal Article · Fri Nov 29 04:00:00 EST 1991 · Science (Washington, D.C.); (United States)

DOI:https://doi.org/10.1126/science.254.5036.1350· OSTI ID:7292616

Vaughan, G B M; Heiney, P A; Fischer, J E; Luzzi, D E; Ricketts-Foot, D A; McGhie, A R; Romanow, W J; Allen, B H; Coustel, N; McCauley, Jr, J P; Smith, III, A B ^[1]; Hui, Yiuwing; Smith, A L ^[2]; Cox, D E ^[3]

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1. Univ. of Pennsylvania, Philadelphia PA (United States)
2. Drexel Univ., Philadelphia, PA (United States)
3. Brookhaven National Lab., Upton, NY (United States)

The high-temperature structure of solvent-free C{sub 70} has been determined with high-resolution x-ray powder diffraction and electron microscopy. Samples crystallized from solution form hexagonal close-packed crystals that retain an appreciable amount of residual toluene, even after prolonged heating. Samples prepared by sublimation, which contain no detectable solvent, are primarily face-centered cubic with some admixture of a hexagonal phase. The relative volume of the hexagonal phase can be further reduced by annealing. The structures of both phases are described by a model of complete orientational disorder. The cubic phase contains an appreciable density of stacking faults along the (111) direction.

• DOE Contract Number: FG05-90ER75596; AC02-76CH00016
• OSTI ID: 7292616
• Journal Information: Science (Washington, D.C.); (United States), Journal Name: Science (Washington, D.C.); (United States) Vol. 254:5036; ISSN SCIEA; ISSN 0036-8075
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400201 -- Chemical & Physicochemical Properties
ANNEALING
CARBON
COHERENT SCATTERING
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CUBIC LATTICES
DATA
DIFFRACTION
ELECTRON MICROSCOPY
ELEMENTS
EXPERIMENTAL DATA
FCC LATTICES
FULLERENES
HEAT TREATMENTS
INFORMATION
MICROSCOPY
MILLER INDICES
NONMETALS
NUMERICAL DATA
PHASE STUDIES
RESOLUTION
SCATTERING
SPATIAL RESOLUTION
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION