Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Mixing of III-V compound semiconductor superlattices

Thesis/Dissertation ·
OSTI ID:7292382
In this work, the methods as well as mechanisms of III-V compound superlattice mixing are discussed, with particular attention on the AlGaAs based superlattice system. Comparative studies of ion-induced mixing showed two distinct effects resulting from ion implantation followed by a thermal anneal; i.e. collisional mixing and impurity induced mixing. It was found that Ga and As ion induced mixing are mainly due to the collisional effect, where the extent of the mixing can be estimated theoretically, with the parameters of ion mass, incident energy and the implant dose. The impurity effect was dominant for Si, Ge, Be, Zn and Te. Quantitative studies of impurity induced mixing have been conducted on samples doped with Si or Te during the growth process. It was discovered that Si induced AlGaAs superlattice mixing yielded an activation energy of approximately 4 eV for the Al diffusion coefficient with a high power law dependence of the prefactor on the Si concentration. In the Te doped AlGaAs superlattice the Al diffusion coefficient exhibited an activation energy of {approximately}3.0 eV, with a prefactor approximately proportional to the Te concentration. These results are of importance in examining the current diffusion models. Zn and Si induced InP/InGaAs superlattice mixing are examined. It was found that Zn predominantly induces cation interdiffusion, while Si induces comparable cation and anion interdiffusion. In addition, widely dispersed Zn rich islands form with Zn residing in the InP layers in the form of Zn{sub 3}P{sub 2}. With unstrained starting material, the layer bandgap disparity increases due to mixing induced strain, while in the Si diffused sample the mixed region would be expected to exhibit bandgaps intermediate between those of the original layers. Semiconductor superlattice mixing shows technological potential for optoelectronic device fabrication.
Research Organization:
Rutgers--the State Univ., New Brunswick, NJ (United States)
OSTI ID:
7292382
Country of Publication:
United States
Language:
English

Similar Records

Low-energy cathodoluminescence spectroscopy studies of III-V superlattice interdiffusion: Optical emission properties of diffusion associated defects
Conference · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) · OSTI ID:7237802

Diffusion Blurring of GaAs Quantum Wells Grown at Low Temperature
Journal Article · Fri Dec 14 23:00:00 EST 2018 · Semiconductors · OSTI ID:22945172

Si diffusion and intermixing in AlGaAs/GaAs structures using buried impurity sources
Journal Article · Mon May 08 00:00:00 EDT 1995 · Applied Physics Letters · OSTI ID:45960