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Title: Effects of substrate misorientation and growth rate on ordering in GaInP

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.355759· OSTI ID:7274136
; ;  [1]
  1. Departments of Materials Science and Engineering and Electrical Engineering, University of Utah, Salt Lake City, Utah 84112 (United States)

Epitaxial layers of Ga[sub [ital x]]In[sub 1[minus][ital x]]P with [ital x][approx]0.52 have been grown by organometallic vapor-phase epitaxy on GaAs substrates misoriented from the (001) plane in the [[bar 1]10] direction by angles [var theta][sub [ital m]], of 0[degree], 3[degree], 6[degree], and 9[degree]. For each substrate orientation growth rates [ital r][sub [ital g]] of 1, 2, and 4 [mu]m/h have been used. The ordering was characterized using transmission electron diffraction (TED), dark-field imaging, and photoluminescence. The (110) cross-sectional images show domains of the Cu-Pt structure separated by antiphase boundaries (APBs). The domain size and shape and the degree of order are found to be strongly affected by both the substrate misorientation and the growth rate. For example, lateral domain dimensions range from 50 A for layers grown with [ital r][sub [ital g]]=4 [mu]m/h and [var theta][sub [ital m]]=0[degree] to 2500 A for [ital r][sub [ital g]]=1 [mu]m/h and [var theta][sub [ital m]]=9[degree]. The APBs generally propagate from the substrate/epilayer interface to the top surface at an angle to the (001) plane that increases dramatically as the angle of misorientation increases. The angle is nearly independent of growth rate. From the superspot intensities in the TED patterns, the degree of order appears to be a maximum for [var theta][sub [ital m]][approx]5[degree]. Judging from the reduction in photoluminescence peak energy caused by ordering, the maximum degree of order appears to occur at [var theta][sub [ital m]][approx]4[degree].

OSTI ID:
7274136
Journal Information:
Journal of Applied Physics; (United States), Vol. 75:10; ISSN 0021-8979
Country of Publication:
United States
Language:
English