Photoconductive circuit element reflectometer

Patent · Tue Jan 23 00:00:00 EST 1990

OSTI ID:7266757

Rauscher, C

A photoconductive reflectometer is described for characterizing semiconductor devices at millimeter wavelength frequencies where a first photoconductive circuit element (PCE) is biased by a direct current voltage source and produces short electrical pulses when excited into conductance by short first laser light pulses. The electrical pulses are electronically conditioned to improve the frequency related amplitude characteristics of the pulses which thereafter propagate along a transmission line to a device under test. Second PCEs are connected along the transmission line to sample the signals on the transmission line when excited into conductance by short second laser light pulses, spaced apart in time a variable period from the first laser light pulses. Electronic filters connected to each of the second PCEs act as low-pass filters and remove parasitic interference from the sampled signals and output the sampled signals in the form of slowed-motion images of the signals on the transmission line. 4 figs.

• Assignee: Dept. of Energy, Washington, DC (United States)
• Patent Number(s): US 4896109; A
• Application Number: PPN: US 7-129210
• OSTI ID: 7266757
• Resource Relation: Patent File Date: 7 Dec 1987
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
OPTICAL EQUIPMENT
DESIGN
SEMICONDUCTOR DEVICES
PERFORMANCE TESTING
ELECTRIC FILTERS
LASER RADIATION
SIGNAL CONDITIONING
ELECTROMAGNETIC RADIATION
EQUIPMENT
FILTERS
RADIATIONS
TESTING
426000* - Engineering- Components
Electron Devices & Circuits- (1990-)
420500 - Engineering- Materials Testing