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X-ray reflectivity of a polymer monolayer at the water/vapor interface

Journal Article · · Journal of Physical Chemistry; (United States)
DOI:https://doi.org/10.1021/j100170a046· OSTI ID:7265852
; ; ; ;  [1];  [2];  [3]
  1. Harvard Univ., Cambridge, MA (United States)
  2. Exxon Research and Engineering Co., Annandale, NJ (United States)
  3. Pennsylvania State Univ., University Park (United States)
X-ray specular reflectivity from a monolayer of partially hydroxylated 1,2-polybutadiene (50% butyl alcohol random substitution) at the water/vapor interface was measured from below the critical wavevector for water, 0.0217 {angstrom}{sup {minus}1}, to Q{sub z} {approx equal} 0.6 {angstrom}{sup {minus}1} (where Q{sub z} is the transferred momentum normal to the interface). The sample was prepared on a Langmuir trough, and measurements were made at five different surface densities in the high-pressure, or saturated, region of the isotherm. The measured reflectivity is interpreted to obtain a profile of the average electron density p(z) as a function of distance z along the surface normal. The profile has a local maximum that is approximately 10% larger than the electron density in bulk crystalline 1,2-polybutadiene. At the highest pressures the width of the liquid/vapor interface is {approximately}10% larger than the value calculated from thermal capillary waves using in situ measurements of the surface tension; however, for smaller pressures the measured and calculated values agree.
DOE Contract Number:
AC02-76CH00016
OSTI ID:
7265852
Journal Information:
Journal of Physical Chemistry; (United States), Journal Name: Journal of Physical Chemistry; (United States) Vol. 95:17; ISSN JPCHA; ISSN 0022-3654
Country of Publication:
United States
Language:
English