Gamma ray flaw detection system
This patent describes in a system for non-destructive examination of a test object by irradiation thereof from a monoenergetic source emitting a collimated beam of radiation and detection of scattered radiation emerging from the irradiated test object within a measurement field to provide scattered radiation density distribution profiles of the field from measurement of energy levels therein, a method of analyzing the detection of flaws in the irradiated test object. The method includes: comparing the radiation density distribution profiles with a reference profile corresponding to measured energy levels of scattered radiation emerging from an irradiated flawless object to provide differential spectra of the field; determining spatial relationships of the measured energy levels in the field relative to the beam of radiation; and extracting location and size data of the flaws in the test object from the differential spectra by data transformation thereof in accordance with the determined spatial relationships.
- Assignee:
- Florida Nuclear Associates, Inc., Gainesville, FL
- Patent Number(s):
- US 4870669
- Application Number:
- PPN: US 7-044718A
- OSTI ID:
- 7256507
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
420500 -- Engineering-- Materials Testing
440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DEFECTS
DESIGN
DETECTION
ELECTROMAGNETIC RADIATION
GAMMA DETECTION
GAMMA RADIATION
GAMMA SPECTRA
IONIZING RADIATIONS
IRRADIATION
MATERIALS
MATERIALS TESTING
MEASURING INSTRUMENTS
NONDESTRUCTIVE TESTING
RADIATION DETECTION
RADIATION DETECTORS
RADIATIONS
SPECTRA
TESTING