Beryllium-aluminum-phosphorus-silicon-oxide molecular sieve compositions
Patent
·
OSTI ID:7256369
Crystalline molecular sieves comprising three-dimensional microporous framework structures of BeO/sub 2/, AlO/sub 2/, PO/sub 2/ and SiO/sub 2/ tetrahedral units having an empirical chemical composition on an anhydrous basis expressed by the formula: mR:(Be/sub w/Al/sub x/P/sub y/Si/sub z/)O/sub 2/ wherein ''R'' represents at least one organic templating agent present in the intracrystalline pore system; ''m'' represents the molar amount of ''R'' present per mole of (Be/sub w/Al/sub x/P/sub y/Si/sub z/)O/sub 2/ and has a value of zero to about 0.3; and ''w'', ''x'', ''y'' and ''z'' represent the mole fractions of beryllium, aluminum, phosphorus and silicon, respectively, present as tetrahedral oxides, the mole fractions being such that they are within the pentagonal compositional area defined by points A,B,C,D, and E of FIG. The crystalline molecular sieves is described having a characteristic X-ray powder diffraction pattern which contains at least the d-spacings set forth in one of the listed tables.
- Assignee:
- Union Carbide Corp., Danbury, CT
- Patent Number(s):
- US 4737353
- OSTI ID:
- 7256369
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400201* -- Chemical & Physicochemical Properties
ADSORBENTS
ALKALINE EARTH METAL COMPOUNDS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
BERYLLIUM COMPOUNDS
BERYLLIUM OXIDES
CHALCOGENIDES
CHEMICAL COMPOSITION
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
MICROSTRUCTURE
MOLECULAR SIEVES
OXIDES
OXYGEN COMPOUNDS
PHOSPHORUS COMPOUNDS
PHOSPHORUS OXIDES
POROSITY
QUANTITY RATIO
SCATTERING
SILICON COMPOUNDS
SILICON OXIDES
STRUCTURAL CHEMICAL ANALYSIS
X-RAY DIFFRACTION
400201* -- Chemical & Physicochemical Properties
ADSORBENTS
ALKALINE EARTH METAL COMPOUNDS
ALUMINIUM COMPOUNDS
ALUMINIUM OXIDES
BERYLLIUM COMPOUNDS
BERYLLIUM OXIDES
CHALCOGENIDES
CHEMICAL COMPOSITION
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
MICROSTRUCTURE
MOLECULAR SIEVES
OXIDES
OXYGEN COMPOUNDS
PHOSPHORUS COMPOUNDS
PHOSPHORUS OXIDES
POROSITY
QUANTITY RATIO
SCATTERING
SILICON COMPOUNDS
SILICON OXIDES
STRUCTURAL CHEMICAL ANALYSIS
X-RAY DIFFRACTION