Computation of closest bifurcations in power systems
Journal Article
·
· IEEE Transactions on Power Systems (Institute of Electrical and Electronics Engineers); (United States)
- Univ. of Wisconsin, Madison, WI (United States). Electrical Computer Engineering Dept.
Voltage collapse and blackout can occur in an electric power system when load powers vary so that the system loses stability in a saddle node bifurcation. This paper computes load powers at which bifurcation occurs and which are locally closest to given operating load powers. The distance in load power parameter space to this locally closest bifurcation is an index of voltage collapse and a minimum load power margin. The computations are illustrated for several power systems. Monte-Carlo optimization techniques are applied to obtain multiple minimum load power margins. The use of load power margin sensitivities to select system controls is discussed.
- OSTI ID:
- 7251086
- Journal Information:
- IEEE Transactions on Power Systems (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Power Systems (Institute of Electrical and Electronics Engineers); (United States) Vol. 9:2; ISSN ITPSEG; ISSN 0885-8950
- Country of Publication:
- United States
- Language:
- English
Similar Records
New methods for computing a closest saddle node bifurcation and worst case load power margin for voltage collapse
A method to approximate a closest loadability limit using multiple load flow solutions
Bifurcation, chaos, and voltage collapse in power systems
Journal Article
·
Sun Aug 01 00:00:00 EDT 1993
· IEEE Transactions on Power Systems (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5676775
A method to approximate a closest loadability limit using multiple load flow solutions
Journal Article
·
Fri Jan 31 23:00:00 EST 1997
· IEEE Transactions on Power Systems
·
OSTI ID:484930
Bifurcation, chaos, and voltage collapse in power systems
Journal Article
·
Tue Oct 31 23:00:00 EST 1995
· Proceedings of the IEEE
·
OSTI ID:137106