Photoemission spectra from conduction bands and core levels of sputter-deposited tantalum films
Photoemission spectra of tantalum films, deposited by dc sputtering onto a room-temperature substrate, were obtained using a monochromatized aluminum x-ray source (Al K..cap alpha../sub 1//sub ,//sub 2/: 1486.6 eV) and a helium uv resonance lamp (He I: 21.2 eV, and He II: 40.8 eV). The x-ray photoemission spectra (XPS) were used to determine the density of electron states in the conduction band, the core-level binding energies, the spin-orbit splitting, and the chemical shift due to surface contamination. The much higher resolution ultraviolet photoemission spectra (UPS) were used to improve resolution of the conduction-band density of states near the Fermi level and to determine the work function. UPS data were also used to precisely calibrate the XPS energies. Comparison with similar experiments on tungsten indicate that the conduction bands are consistent with a rigid-band model. (AIP)
- Research Organization:
- Department of Physics and Astronomy, University of Massachusetts, Amherst, Massachusetts 01002
- OSTI ID:
- 7249180
- Journal Information:
- Phys. Rev., B; (United States), Journal Name: Phys. Rev., B; (United States) Vol. 14:10; ISSN PLRBA
- Country of Publication:
- United States
- Language:
- English
Similar Records
Photoemission and electronic structure of iron
Photoelectrochemically Self Improving Si/GaN Photocathode: Figure 3c Raw Data
Related Subjects
360104* -- Metals & Alloys-- Physical Properties
640301 -- Atomic
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTROMAGNETIC RADIATION
ELECTRONIC STRUCTURE
ELEMENTS
EMISSION
ENERGY LEVELS
FERMI LEVEL
FILMS
IONIZING RADIATIONS
MEDIUM TEMPERATURE
METALS
PHOTOEMISSION
RADIATIONS
REFRACTORY METALS
SECONDARY EMISSION
SPECTRA
TANTALUM
TRANSITION ELEMENTS
WORK FUNCTIONS
X RADIATION