Grain boundaries and defects in superconducting Bi-Sr-Ca-Cu-O ceramics
- Bellcore, Red Bank, New Jersey 07701 (USA)
- Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, California 92093 (USA)
Defects and structural interfaces in superconducting Bi-Sr-Ca-Cu-O have been characterized by transmission electron microscopy. The superconducting phase exhibits frequent variations in the stacking sequence (polytypoids). Dislocations, observed inside the grains, either introduce or accommodate the shear in the {ital a}-{ital b} plane and the local composition fluctuations. In general, the grains exhibit a platelike morphology with the {ital a}-{ital b} plane as the grain boundary plane. Grain boundaries along the short edge are generally disordered, whereas those near the long edge generally have a thin layer of the lower {ital T}{sub {ital c}} polytypoid. Coherent intragranular boundaries are also observed.
- OSTI ID:
- 7246908
- Journal Information:
- Journal of Applied Physics; (USA), Journal Name: Journal of Applied Physics; (USA) Vol. 67:1; ISSN 0021-8979; ISSN JAPIA
- Country of Publication:
- United States
- Language:
- English
Similar Records
Bi-Ca-Sr-Cu-O superconductors: The connectivity issue
Direct observation of discommensurate walls in Bi-Ca-Sr-Cu-O superconductors
Related Subjects
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
BISMUTH COMPOUNDS
BISMUTH OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CERAMICS
CHALCOGENIDES
COPPER COMPOUNDS
COPPER OXIDES
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DISLOCATIONS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
FLUCTUATIONS
GRAIN BOUNDARIES
LINE DEFECTS
MICROSCOPY
MICROSTRUCTURE
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
QUANTITY RATIO
STRONTIUM COMPOUNDS
STRONTIUM OXIDES
SUPERCONDUCTORS
TEMPERATURE DEPENDENCE
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
VARIATIONS