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Title: The role of cemented WC substrate morphology on the diamond film growth and cracking resistance

Journal Article · · Scripta Metallurgica et Materialia; (United States)
;  [1];  [2]
  1. Inst. of Mechanical Engineering, National Chiao Tung Univ., Hsinchu (TW)
  2. Materials Research Lab., ITRI, Chutung (TW)

Chemical vapor deposition (CVD) synthetic diamond film is well known and widely studied recently for its potential applications in many engineering fields. Due to its extreme strength and hardness, good abrasive resistance, and low friction coefficient, the synthetic film can be used in tribological situations such as machining or wear resistant coatings. In these cases, the film can be grown on cutting tools, dies or sleeves directly. It is expected that the grown film must possess good properties such as film uniformity, smoothness, and especially good adhesion strength (cracking resistance). And these properties are believed to relate to the substrate morphology intimately. In this paper, the authors report on an investigation of the influence of cemented tungsten carbide substrate morphology on the diamond film growth and cracking resistance.

OSTI ID:
7241849
Journal Information:
Scripta Metallurgica et Materialia; (United States), Vol. 26:9
Country of Publication:
United States
Language:
English