X-ray spectral microanalysis of antimony telluride single crystals doped with tin and thallium

Journal Article · Sun Jun 01 04:00:00 EDT 1986 · Inorg. Mater. (Engl. Transl.); (United States)

OSTI ID:7240769

Mavlonov, S; Sherov, P N

Single crystals of thallium-doped antimony telluride were grown from a melt by the Czochralski method; as a result, the impurity distribution was distributed more uniformly in the melt and the concentration in the liquid and solid phases is not observed to vary during the growth process. The authors considered the case when the antimony telluride single crystals were observed to have excess tellurium. It is shown that Sb/sub 2/Te/sub 3/ single crystals doped with 0.01 mass % Th and 0.1-1.0 mass % Sn have a uniform impurity distribution.

• Research Organization: Umarov Physico technical Institute, Tadzhik SSR Acad. of Sci.
• OSTI ID: 7240769
• Journal Information: Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 22:1; ISSN INOMA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
ANTIMONY COMPOUNDS
ANTIMONY TELLURIDES
CHALCOGENIDES
CHEMICAL ANALYSIS
CRYSTAL DEFECTS
CRYSTAL DOPING
CRYSTAL GROWTH
CRYSTAL GROWTH METHODS
CRYSTAL STRUCTURE
CRYSTALS
CZOCHRALSKI METHOD
DISLOCATIONS
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON MICROPROBE ANALYSIS
ELEMENTS
IMPURITIES
LINE DEFECTS
MATERIALS
METALLURGICAL EFFECTS
METALS
MICROANALYSIS
MONOCRYSTALS
P-TYPE CONDUCTORS
PHYSICAL PROPERTIES
POINT DEFECTS
SEMICONDUCTOR MATERIALS
SPECTRA
TELLURIDES
TELLURIUM COMPOUNDS
THALLIUM
TIN
VACANCIES
X-RAY SPECTRA