Surface resistance of large-area Tl[sub 2]Ba[sub 2]CaCu[sub 2]O[sub 8] thin films at microwave and millimeter wave frequencies measured by three noncavity techniques

Journal Article · Tue Jun 01 00:00:00 EDT 1993 · Journal of Superconductivity; (United States)

DOI:https://doi.org/10.1007/BF00625746· OSTI ID:7236398

Holstein, W L; Parisi, L A; Shen, Z Y; Wilker, C; Brenner, M S ^[1]; Martens, J S ^[2]

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1. Du Pont Central Research and Development, Wilmington, DE (United States)
2. Sandia National Lab., Allbuquerque, NM (United States)

The surface resistance R[sub s] of Tl[sub 2]Ba[sub 2]CaCu[sub 2]O[sub 8] films fabricated on LaAlO[sub 3] wafers up to 3 inches (7.6 cm) in diameter through a post-deposition anneal process was measured over the frequency range 5.55-94.1 GHz by the following techniques: 5.55 and 27.5 GHz high-temperature superconductor (HTS)-sapphire resonators, 10 GHz parallel plate resonator, and 94.1 GHz scanning confocal resonator. R[sub s] was found to exhibit a quadratic dependence on frequency f at 77 K: R[sub s] oc f[sup 2.0][+-](0.1). The highest-quality films The highest-quality films yield R[sub s] = 145 [+-] 15 [mu][Omega] at 10 GHz and 77 K. Scanning confocal resonator mapping of R[sub s] across a 2-inch (5.1 cm) diameter wafer yielded a base value for R[sub s] of 16 [+-] 1 m[Omega] at 77 K and 94.1 GHz (equivalent to 180 [+-] 10 [mu][Omega] at 10 GHz) and good uniformity in R[sub s] across the wafer. HTS-sapphire resonator measurements of R[sub s] for fifteen 1.2 cm square parts cut from a 3-inch diameter wafer yielded R[sub s] values scaled to 10 GHz of 196 [+-] 10 [mu][Omega] at 80 K. Similar values were measured for Tl[sub 2]Ba[sub 2]CaCu[sub 2]O[sub 8] films prepared on both sides of a 2-inch diameter wafer. R[sub s] values at 10 GHz and 80 K of 147-214 [mu][Omega] were maintained over the course of 40 independent and successive deposition runs and corresponding anneals under nominally identical film fabrication conditions. Surface resistance at 5.55 GHz remained below 80 [mu][Omega] for maximum rf magnetic fields up to 85 Oe at 4.2 K and 7 Oe at 80 K, respectively. 45 refs., 6 figs., 1 tab.

• OSTI ID: 7236398
• Journal Information: Journal of Superconductivity; (United States), Vol. 6:3; ISSN 0896-1107
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CERAMICS
SUPERCONDUCTIVITY
HIGH-TC SUPERCONDUCTORS
ELECTRIC CONDUCTIVITY
SUPERCONDUCTING FILMS
FABRICATION
BARIUM COMPOUNDS
CALCIUM COMPOUNDS
CUPRATES
MAGNETIC FIELDS
MICROWAVE EQUIPMENT
STRONTIUM COMPOUNDS
SUPERCONDUCTING DEVICES
SURFACE PROPERTIES
THALLIUM COMPOUNDS
THIN FILMS
ALKALINE EARTH METAL COMPOUNDS
COPPER COMPOUNDS
ELECTRICAL PROPERTIES
ELECTRONIC EQUIPMENT
EQUIPMENT
FILMS
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SUPERCONDUCTORS
TRANSITION ELEMENT COMPOUNDS
360207* - Ceramics
Cermets
& Refractories- Superconducting Properties- (1992-)
665411 - Basic Superconductivity Studies- (1992-)
665412 - Superconducting Devices- (1992-)