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Atomic force microscope and scanning tunneling microscope studies of superlattices and density waves in Fe doped NbSe[sub 2], TaSe[sub 2], TaS[sub 2] and in NbSe[sub 3] doped with Fe, Co, Cr, and V

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
DOI:https://doi.org/10.1116/1.587603· OSTI ID:7236319
; ; ; ;  [1]
  1. Department of Physics, University of Virginia, Charlottesville, Virginia 22901 (United States)
Results of atomic force microscope (AFM) and scanning tunneling microscope (STM) studies of superlattices and long-range modulations induced by impurities in transition metal chalcogenides are presented. Superlattices formed by Fe intercalation into the van der Waals gaps of 2H--NbSe[sub 2], 2H--TaSe[sub 2] and 2H--TaS[sub 2] show ordered occupation of the octahedral holes and STM spectroscopy shows density-wave energy gaps existing in the antiferromagnetic phases. In NbSe[sub 3], interstitial impurities such as Fe, Co, Cr, and V induce long-range modulated structures that can be detected at room temperature with AFM scans. These modulations modify the charge-density wave structure forming at low temperature and STM spectroscopy has been used to measure these changes.
OSTI ID:
7236319
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States), Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States) Vol. 12:3; ISSN JVTBD9; ISSN 0734-211X
Country of Publication:
United States
Language:
English