Cryostat for accurate x-ray diffractometry of crystalline helium to 60 mK and 25 MPa

Journal Article · Tue Mar 01 04:00:00 EST 1977 · Rev. Sci. Instrum.; (United States)

DOI:https://doi.org/10.1063/1.1135016· OSTI ID:7224552

Heald, S M; Simmons, R O

A cryostat designed for accurate x-ray diffractometry of crystalline helium and other solidified gases is described and its performance characterized. The cryostat is a rigid tail design. It holds the crystal, grown at pressures up to 25 MPa, in fixed orientation and position independent of the levels of the cryogenic fluids. Such stability is necessary for crystal growth, orientation, characterization, and measurements of x-ray reflection intensities and x-ray scattering. A combination of beryllium and aluminized Mylar x-ray windows permits x-ray access to the specimen crystal over broad angular ranges, essentially 360degree in polar angle and +- 40degree in inclination. At the same time, thermal radiation is small enough to permit temperatures as low as 60 mK to be achieved with a simple dilution refrigerator.

• Research Organization: Department of Physics and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Illinois 61801
• OSTI ID: 7224552
• Journal Information: Rev. Sci. Instrum.; (United States), Journal Name: Rev. Sci. Instrum.; (United States) Vol. 48:3; ISSN RSINA
• Country of Publication: United States
• Language: English

Related Subjects

420201* -- Engineering-- Cryogenic Equipment & Devices
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COHERENT SCATTERING
CONTROL EQUIPMENT
CRYOGENIC FLUIDS
CRYOSTATS
CRYSTAL STRUCTURE
DESIGN
DIFFRACTION
ELEMENTS
EQUIPMENT
FLUIDS
HELIUM
NONMETALS
PERFORMANCE
RARE GASES
SCATTERING
THERMOSTATS
ULTRALOW TEMPERATURE
X-RAY DIFFRACTION