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Beam profile measurements for KEK 12 GeV proton synchrotron

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:7211941

Various beam profile monitor systems provide an invaluable tool for studying beam behavior throughout the acceleration cycle in the main ring and booster. Non-destructive slow profile monitors are used for injection, magnet, rf, internal target and fast extraction studies. The time resolution of the slow profile monitor is 30 ..mu..sec. A multiwire secondary emission profile monitor which is sensitive enough to work with single bunch is used for injection tuning. Single wire secondary emission scanners are used for the circulating beam. These profile monitors are cross-checked in precision. As an application of non-destructive profile monitoring, a position monitor is installed in main ring and booster.

Research Organization:
National Lab. for High Energy Physics, Ibaraki, Japan
OSTI ID:
7211941
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-24:3; ISSN IETNA
Country of Publication:
United States
Language:
English