Dimensions of luminescent oxidized and porous silicon structures

Journal Article · Mon Apr 18 04:00:00 EDT 1994 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.72.2648· OSTI ID:7207445

Schuppler, S; Friedman, S L; Marcus, M A; Adler, D L; Xie, Y; Ross, F M; Harris, T D; Brown, W L; Chabal, Y J; Brus, L E; Citrin, P H ^[1]

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1. AT T Bell Laboratories, Murray Hill, New Jersey 07974 (United States) National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)

X-ray absorption measurements from H-passivated porous Si and from oxidized Si nanocrystals, combined with electron microscopy, ir absorption, [alpha] recoil, and luminescence emission data, provide a consistent structural picture of the species responsible for the visible luminescence observed in these samples. The mass-weighted average structures in por-Si are particles, not wires, with dimensions significantly smaller than previously reported or proposed.

• DOE Contract Number: AC03-76SF00098
• OSTI ID: 7207445
• Journal Information: Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 72:16; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
360606 -- Other Materials-- Physical Properties-- (1992-)
665100 -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTRA
CHEMICAL REACTIONS
ELECTRON MICROSCOPY
ELEMENTS
HYDROGENATION
INFRARED SPECTRA
LUMINESCENCE
MATERIALS
MICROSCOPY
MICROSTRUCTURE
OXIDATION
PHOTOLUMINESCENCE
POROUS MATERIALS
SEMIMETALS
SILICON
SPECTRA
SPECTROSCOPY
X-RAY SPECTROSCOPY