Photodetachment of H sup minus in the presence of a low-frequency laser field

Journal Article · Sun Mar 01 04:00:00 EST 1992 · Physical Review A. General Physics; (United States)

DOI:https://doi.org/10.1103/PhysRevA.45.3268· OSTI ID:7205876

Bivona, S; Burlon, R; Leone, C ^[1]

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1. Dipartimento di Energetica ed Applicazioni di Fisica, Parco D'Orleans, 90128 Palermo (Italy)

The photodetachment of a model one-electron ion simulating H{sup {minus}} in the presence of a low-frequency field is analyzed. Two different geometries are considered in order to get information on the effect of the ponderomotive energy shift {Delta} on the photodetachment cross section. Our calculations suggest that a correspondence may be established between the ponderomotive shift and the photodetachment cross section, when the ejected electron may exchange only a few low-frequency photons. This is in qualitative agreement with recent experimental observations. When a large number of processes are open in which the detached electron may exchange low-frequency photons with comparable probability, it is impossible to make any connection between ponderomotive threshold shift and photodetachment cross section which, instead, may be described in terms of a field picture.

• OSTI ID: 7205876
• Journal Information: Physical Review A. General Physics; (United States), Journal Name: Physical Review A. General Physics; (United States) Vol. 45:5; ISSN 1050-2947; ISSN PLRAA
• Country of Publication: United States
• Language: English

Related Subjects

664100* -- Theory of Electronic Structure of Atoms & Molecules-- (1992-)
74 ATOMIC AND MOLECULAR PHYSICS
ANIONS
ATOMIC IONS
BINDING ENERGY
CHARGED PARTICLES
CROSS SECTIONS
ELECTROMAGNETIC RADIATION
ELECTRON DETACHMENT
ELECTRON SPECTROSCOPY
ENERGY
HYDROGEN IONS
HYDROGEN IONS 1 MINUS
INFRARED RADIATION
IONIZATION
IONS
KINETIC ENERGY
MICROWAVE RADIATION
MULTI-PHOTON PROCESSES
PHOTOELECTRON SPECTROSCOPY
PHOTOIONIZATION
RADIATIONS
SPECTROSCOPY
THRESHOLD ENERGY