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Title: Feasibility of infrared imaging arrays using high- T sub c superconducting bolometers

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.351063· OSTI ID:7205722
;  [1];  [2];  [3];  [4]
  1. Department of Physics, University of California and Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)
  2. Conductus Inc., Sunnyvale, California 94086 (United States)
  3. Xerox Palo Alto Research Center, Palo Alto, California 94304 (United States) Department of Applied Physics, Stanford University, Stanford, California 94305 (United States)
  4. Department of Applied Physics, Stanford University, Stanford, California 94305 (United States)

The design of high-{ital T}{sub {ital c}} superconducting bolometers for applications such as infrared imaging arrays is discussed. The dependence of bolometer sensitivity on excess voltage noise in the thermometer is a function of the detector area and thus of the wavelength to be detected. Measurements of the voltage noise in thin films of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} on Si, Si{sub 3}N{sub 4}, and sapphire substrates are used to predict the performance of different bolometer architectures. Useful opportunities exist for bolometers made on both Si and Si{sub 3}N{sub 4} membranes. A readout scheme for two-dimensional arrays of bolometers is also described in which real-time signal integration is performed on the chip.

DOE Contract Number:
AC03-76SF00098
OSTI ID:
7205722
Journal Information:
Journal of Applied Physics; (United States), Vol. 71:6; ISSN 0021-8979
Country of Publication:
United States
Language:
English