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Title: Critical current density and microstructure of YBa[sub 2]Cu[sub 3]O[sub 7] thin films post-annealed at a low oxygen partial pressure

Journal Article · · Journal of Superconductivity; (United States)
DOI:https://doi.org/10.1007/BF00618058· OSTI ID:7205493
; ;  [1]
  1. GE Research and Development Center, Schenectady, NY (United States)

Post-annealing of thin films of YBa[sub 2]Cu[sub 3]O[sub 7] (YBCO) has been performed at 29 Pa and 750[degrees]C. For films 0.6 [mu]m thick, a critical current density >1 MA cm[sup [minus]2] is obtained at 77 K, with a sharp eddy current response at 25 MHz. Microstructural investigation of these films by cross-sectional and planar transmission electron microscopy reveals that the YBCO film has the c-axis normal to the plane of the substrate in a continuous sheet of varying thickness, frequently covering the entire thickness of the film. Mutually perpendicular rods with the c-axis in the plane of the LaAlO[sub 3] substrate are also seen. The microstructure and critical current density of these films are compared with those of previously reported films post-annealed in atmospheric pressure oxygen. 7 refs., 4 figs.

OSTI ID:
7205493
Journal Information:
Journal of Superconductivity; (United States), Vol. 5:2; ISSN 0896-1107
Country of Publication:
United States
Language:
English

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