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Modeling the degradation of nuclear components

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:7191773
;  [1];  [2]
  1. Brookhaven National Lab., Upton, NY (United States)
  2. Science Applications International Corp., Dublin, OH (United States)
This paper describes component level reliability models that use information on degradation to predict component reliability, and which have been used to evaluate different maintenance and testing policies. The models are based on continuous time Markov processes, and are a generalization of reliability models currently used in Probabilistic Risk Assessment. An explanation of the models, the model parameters, and an example of how these models can be used to evaluate maintenance policies are discussed.
OSTI ID:
7191773
Report Number(s):
CONF-931051--
Conference Information:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 41:4Pt1
Country of Publication:
United States
Language:
English