A low background x-ray fluorescence system for microsphere quantitation

Conference · Mon Feb 01 04:00:00 EST 1988 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:7189229

Morita, Y; Hosier, K E; Lorenz, V; Kaufman, L; Mori, H; Hoffman, J E

An automated low background x-ray fluorescence detection system was developed for measuring blood flow rates by the microsphere technique. An x-ray beam was polarized to lower Compton scattering. A Si(Li) detector was used for efficient characteristic x-ray detection with preferentially decreased sensitivity for Compton scattering, a CaF/sub 3/ scintillation detector was engaged in the anti-coincidence method to lower the background, and rise-time rejection was used for the same purpose. One cm/sup 3/ solutions of Rb, Mo, Ag, I, La and Gd with concentration of 0.2-2.0 ppm were measured for 80 minutes and those of 1.0-20 ppm were measured for 10 minutes. For silver, the net counting rate was --75 counts/min/ppm. The anti coincidence detector lowered the background by 10% in the region of silver x-rays. The linear relation between net counts and actual element concentration held up to 1000 ppm for silver solutions.

• Research Organization: Univ. of California, San Francisco, CA (US)
• OSTI ID: 7189229
• Report Number(s): CONF-871006-
• Conference Information: Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: 35:1
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400101 -- Activation
Nuclear Reaction
Radiometric & Radiochemical Procedures
440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALKALINE EARTH METAL COMPOUNDS
BLOOD FLOW
CALCIUM COMPOUNDS
CALCIUM FLUORIDES
CALCIUM HALIDES
CHEMICAL ANALYSIS
COMPTON SCATTERING TOMOGRAPHY
DIAGNOSTIC TECHNIQUES
DISPERSIONS
ELEMENTS
FLUORIDES
FLUORINE COMPOUNDS
HALIDES
HALOGEN COMPOUNDS
HALOGENS
IODINE
LANTHANUM
LIQUID SCINTILLATION DETECTORS
MEASURING INSTRUMENTS
METALS
MICROSPHERES
MIXTURES
MOLYBDENUM
NONDESTRUCTIVE ANALYSIS
NONMETALS
RADIATION DETECTORS
RARE EARTHS
SCINTILLATION COUNTERS
SILVER
SOLUTIONS
TECHNOLOGY ASSESSMENT
TOMOGRAPHY
TRANSITION ELEMENTS
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS