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Radiation effect on GaAs interface. Final report, Feb 1974--Aug 1975. [Neutron radiation]

Technical Report ·
OSTI ID:7188026
The C-V and Q-V technique was applied to the study of interface charge distributions of GaAs epitaxial layers grown on semi-insulating substrates. Changes of mobility and free carrier concentration in the epitaxial layer and extending through the interface into the substrate were determined before and after exposure to a neutron fluence of 2.7 x 10 to the 15th power n/sq cm and a total dose of ionizing radiation of 10 to the 8th power rad (GaAs). Changes at the interface and in the epitaxial layer are correlated with the voltage-current characteristic variations of the GaAs junction field-effect transistors. (GRA)
Research Organization:
McDonnell Douglas Astronautics Co., Huntington Beach, CA (USA)
OSTI ID:
7188026
Report Number(s):
AD-A-015767
Country of Publication:
United States
Language:
English