Correlation between volatility of rare-earth metals and encapsulation of their carbides in carbon nanocapsules
- Mie Univ., Tsu (Japan)
- Tohoku Univ., Sendai (Japan)
Encapsulation of metals in multilayered graphitic capsules has been studied for all the rare-earth elements (Sc, Y, and Ln = La, Ce, ..., Lu) excluding Pm by using electric arc discharge. Electron microscopy and X-ray diffraction of carbonaceous products revealed that most of rare-earth metals (Sc, Y, La, Ce, Pr, Nd, Gd, Tb, Dy, Ho, Er, and Lu) were encapsulated in the form of carbides, but the others, Sm, Eu, and Yb, were not. The metals in the former group that were encapsulated had vapor pressures definitely lower than those in the latter group. In the case of thulium (Tm), whose vapor pressure is intermediate between the two groups, only a trace amount of encapsulated carbide was formed. Correlation of volatility of metals with encapsulation was clearly found, suggesting that the volatility of a metal plays an important role in a process of the metal encapsulation. 25 refs., 4 figs., 1 tab.
- OSTI ID:
- 7164607
- Journal Information:
- Journal of Physical Chemistry; (United States), Journal Name: Journal of Physical Chemistry; (United States) Vol. 98:27; ISSN JPCHAX; ISSN 0022-3654
- Country of Publication:
- United States
- Language:
- English
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38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY
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CARBIDES
CARBON
CARBON COMPOUNDS
COHERENT SCATTERING
CURRENTS
DIFFRACTION
ELECTRIC ARCS
ELECTRIC CURRENTS
ELECTRIC DISCHARGES
ELECTRON MICROSCOPY
ELEMENTAL MINERALS
ELEMENTS
ENCAPSULATION
FULLERENES
GRAPHITE
METALS
MICROSCOPY
MINERALS
NONMETALS
RARE EARTH COMPOUNDS
RARE EARTHS
SCATTERING
TRANSMISSION ELECTRON MICROSCOPY
VOLATILITY
X-RAY DIFFRACTION