High energy x-ray film response and the intensifying action of metal screens

Conference · Tue Dec 01 04:00:00 EST 1987 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:7157089

Barnea, G; Ginzburg, A

Accurate measurements and electron/photon transport calculations provide evidence that the film's optical density is a single-valued function of the absorbed dose in the emulsion of industrial x-ray films. As a result, the film sensitivity is proportional to the absorbed dose in the emulsion per roentgen. Spectral sensitivity is calculated for energies between 20 keV and 10 MeV and for various film-screen combinations. The intensifying action of metal screens on film sensitivity is calculated as a function of screen's thickness for various photon energies and film-screen combinations. The results of the calculations are supported by the experimental data.

• Research Organization: Rafael Labs., P.O.B. 2250, Haifa (IL)
• OSTI ID: 7157089
• Report Number(s): CONF-8707112-
• Conference Information: Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: NS-34:6
• Country of Publication: United States
• Language: English

Related Subjects

07 ISOTOPE AND RADIATION SOURCES
070204 -- Radiation Sources-- Industrial Uses
Radiometric
36 MATERIALS SCIENCE
360104 -- Metals & Alloys-- Physical Properties
654001* -- Radiation & Shielding Physics-- Radiation Physics
Shielding Calculations & Experiments
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
ABSORPTION
CALCULATION METHODS
DATA
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELECTRON TRANSFER
ELEMENTS
ENERGY ABSORPTION
EXPERIMENTAL DATA
FUNCTIONS
IMAGE PROCESSING
INFORMATION
IONIZING RADIATIONS
MATERIALS TESTING
METALS
NEUTRAL-PARTICLE TRANSPORT
NUCLEAR EMULSIONS
NUMERICAL DATA
OPTICAL PROPERTIES
PHOTON TRANSPORT
PHYSICAL PROPERTIES
PROCESSING
RADIATION TRANSPORT
RADIATIONS
RADIOSENSITIVITY
SCREENS
SPECTRAL DENSITY
SPECTRAL FUNCTIONS
TESTING
THICKNESS
X RADIATION