Evaluation of the Kulite semiconductor strain gage, model M(6) EP-120-500W, spotwelded to P-110 pipe material. [Simulated Nevada Test Site conditions]

Technical Report · Tue Jul 13 04:00:00 EDT 1976

DOI:https://doi.org/10.2172/7148117· OSTI ID:7148117

Roach, D. R.

The Kulite dual-element, semiconductor strain gage, weldable model M(6)-EP-120-500W, was evaluated in laboratory tests under simulated Nevada Test Site conditions. Two gages were installed on P-110 line-of-sight pipe material. Tension was applied to the test samples to 50 percent of yield (about 2000 microstrain). Immediately following, compression was applied to 100 percent of yield (about 6000 microstrain). The Kulite gages were powered by a dual constant current signal conditioner. Measurements obtained with metal foil strain gages served as reference standards for the Kulite strain gage measurements. The output voltages of the Kulite gages were relatively linear from zero to +2000 microstrain and in the subsequent compression to -2500 microstrain. Below -2500 microstrain, the output voltages from the Kulite gages became decidedly nonlinear and also differed significantly from each other. We feel that the gage spotwelds were failing at strains below -2500 microstrain and consequently that data obtained below this level are not reliable enough to calculate pipe forces. The stated gage factor (Kulite factory) of 220 is about 33 percent higher in tension than the measured gage factor and about 15 percent higher in compression. Adhesive-bonded, metal foil strain gages are recommended for reliable pipe force measurements on future Nevada Test Site events. Metal foil gages consistently are linear and reliably measure strains in excess of +-10,000 microstrain.

• Research Organization: California Univ., Livermore (USA). Lawrence Livermore Lab.
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 7148117
• Report Number(s): UCID-17165
• Country of Publication: United States
• Language: English

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