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Title: Atomic scale observations of the chemical composition of a metal/ceramic interface

Journal Article · · Scripta Metallurgica et Materialia; (United States)
;  [1];  [2]
  1. Dept. of Materials Science and Engineering, Materials Research Center, Northwestern Univ., Evanston, IL (US)
  2. Materials Science Div., Argonne National Lab., Argonne, IL (US)

The heterophase interface between a metal and a ceramic is of great practical importance because of the ubiquitousness of this interface in composite materials, thin film technology and electronic packaging systems. The nature of the chemical bond at a metal/ceramic interface is very important in determining how well these two disparate materials adhere to one another, and ultimately the performance of this heterophase interface in service. On the basic side the question of the nature and strength of the chemical bond at a metal/ceramic interface has been addressed recently from a first principles point-of-view. In this paper, the authors present a combined transmission electron microscopy, HREM and atom-probe field-ion microscopy (APFIM) study of a Cu/MgO heterophase interface produced by internal oxidation of a Cu(Mg) alloy. The authors demonstrate, for the first time, that by combining these three microscopies it is possible to determine the chemical identity of the terminating plane on the oxide side of a Cu/MgO (111)-type interface directly without any deconvolution of the experimental data. In particular, the authors demonstrate that the bonding across a Cu/MgO (111)-type interface, in a common {l angle}111{r angle} direction, has the sequence Cu {vert bar} Mg {vert bar} O {vert bar}...via APFIM measurements of this highly localized chemistry.

DOE Contract Number:
FG02-89ER45403
OSTI ID:
7144053
Journal Information:
Scripta Metallurgica et Materialia; (United States), Vol. 26:9
Country of Publication:
United States
Language:
English