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U.S. Department of Energy
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AEM-based XEDS/EELS microanalysis: a materials science perspective

Conference ·
OSTI ID:7130541
Nearly 50% of electron microscopes sold today come equipped for X-ray Energy Dispersive Spectroscopy (XEDS), and Electron Energy Loss Spectroscopy (EELS) is an old analytical technique. This paper outlines the topics involved in a parallel discussion of XEDS and EELS: basic physics, instrumentation, and specimen preparation/handling; basic quantification, advanced topics, and limitations; and future directions and applications. (DLC)
Research Organization:
Argonne National Lab., IL (USA)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
7130541
Report Number(s):
CONF-860829-39; ON: DE87001516
Country of Publication:
United States
Language:
English