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Title: Single and double ionization of He by slow protons and antiprotons

Journal Article · · Physical Review A; (United States)
 [1];  [2];  [3]
  1. Argonne National Laboratory, Argonne, Illinois 60439 and Department of Physics, Rice University, Houston, Texas 77251 (United States)
  2. Institute of Physical and Chemical Research (RIKEN), Wako, Saitama 351-01 (Japan)
  3. Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Double and single ionization of He by proton ([ital p]) and antiproton ([ital [bar p]]) impact in the energy region below 50 keV is studied theoretically within a molecular picture. As the energy decreases, the ratio of the double- to single-ionization cross section is found to increase for [ital [bar p]] impact and to decrease to [ital p] impact in agreement with recent measurements. For [ital p] impact, the dominant mechanism for double ionization at the lower energies seems to be sequential ladder climbing by the two electrons through various excited channels. For [ital [bar p]] impact, in contrast, the approaching negative charge distorts the He electron cloud toward the other side of the nucleus and decreases the electron binding energies. These effects enhance the important role of electron-electron, interactions, increasing double ionization.

DOE Contract Number:
W-31-109-ENG-38
OSTI ID:
7116615
Journal Information:
Physical Review A; (United States), Vol. 49:6; ISSN 1050-2947
Country of Publication:
United States
Language:
English