Si(Li) x-ray detectors with amorphous Silicon passivation
Lithium drifted SiLi detectors with thin lithium n/sup +/ contacts and amorphous silicon (..cap alpha..-Si) junction passivation are described. These detectors (7mm thick, 9cm/sup 2/ area) are intended for use in a six-element detector array which is designed to measure trace amounts of plutonium is soil samples. Results are given showing a spectral resolution of approx. =400 ev (FWHM) for 17.8 kev N/SUB p/ L x-rays entering through either the lithium n contact or the gold barrier contact on these detectors. Measurements on the effects of the fractional H/sub 2/ concentration on the electrical behavior of the a-Si/Si interface are reported. The increase with time in the lithium window thickness when the detectors are stored at room temperature is discussed.
- Research Organization:
- Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
- OSTI ID:
- 7100253
- Report Number(s):
- CONF-831015-
- Journal Information:
- IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 31:1; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ACTINIDES
ALKALI METALS
AMORPHOUS STATE
DETECTION
DIMENSIONS
ELEMENTS
ENERGY RANGE
ENERGY RESOLUTION
GOLD
HYDROGEN
KEV RANGE
KEV RANGE 10-100
LI-DRIFTED DETECTORS
LI-DRIFTED SI DETECTORS
LITHIUM
MEASURING INSTRUMENTS
METALS
NONMETALS
PASSIVATION
PLUTONIUM
RADIATION DETECTION
RADIATION DETECTORS
RESOLUTION
SEMICONDUCTOR DETECTORS
SEMIMETALS
SI SEMICONDUCTOR DETECTORS
SILICON
SOILS
SPECTRAL RESPONSE
STORAGE LIFE
TEMPERATURE EFFECTS
THICKNESS
TIME DEPENDENCE
TRACE AMOUNTS
TRANSITION ELEMENTS
TRANSURANIUM ELEMENTS
X-RAY DETECTION