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Applications of the ion microprobe to geochemistry and cosmochemistry

Journal Article · · Annu. Rev. Earth Planet. Sci.; (United States)
;
When a solid surface is subjected to a bombardment of energetic ions, material is ejected from the surface in a process known as sputtering. A part of the sputtered material is ionized and these secondary ions can be analyzed with a mass spectrometer according to a technique known as secondary ion mass spectrometry (SIMS). A description is presented of the present status of geochemical and cosmochemical applications of the ion microprobe. Attention is given to the sputtering event, molecular ion interferences, aspects of isotopic fractionation, secondary ion intensities in polycomponent materials, and questions of trace element analysis. Geochemical applications of the ion microprobe are based on certain advantages over other analytical techniques. These advantages are related to high sensitivity, low background, and the capability of in situ analysis of isotopic composition. The distribution of trace elements in minerals is considered, along with isotope anomalies, isotope zoning, diffusion studies, and depth profiling.
Research Organization:
MIT, Cambridge, MA
OSTI ID:
7084914
Journal Information:
Annu. Rev. Earth Planet. Sci.; (United States), Journal Name: Annu. Rev. Earth Planet. Sci.; (United States) Vol. 10; ISSN AREPC
Country of Publication:
United States
Language:
English

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Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400104* -- Spectral Procedures-- (-1987)
58 GEOSCIENCES
580400 -- Geochemistry-- (-1989)
640107 -- Astrophysics & Cosmology-- Planetary Phenomena
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CHARGED PARTICLES
CHEMICAL ANALYSIS
CHEMISTRY
COSMOCHEMISTRY
FRACTIONATION
GEOCHEMISTRY
ION MICROPROBE ANALYSIS
ION PROBES
IONS
ISOTOPE SEPARATION
MASS SPECTROSCOPY
MICROANALYSIS
MOLECULAR IONS
NONDESTRUCTIVE ANALYSIS
PROBES
SEPARATION PROCESSES
SPECTROSCOPY
SPUTTERING
TRACE AMOUNTS