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Measurements of natural radiation effects in a low noise avalanche photodiode

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:7082828

Low noise avalanche photodiodes were irradiated to determine their sensitivity to the natural space environment. Radiation effects on important APD parameters were determined by exposure to 1.5 MeV electrons from a Van de Graaff generator and to gamma rays from a Co/sup 60/ source, both to a total dose of 300 krad (Si). During irradiation, the DC dark current and an associated 1/f noise were found to increase linearly with dose only if bias voltage was applied. A t/sup -X/ annealing behavior was observed. Radiation damage coefficients, threshold dose rates, and threshold fluences are calculated.

Research Organization:
Massachusetts Institute of Technology, Lincoln Lab., P.O. Box 73, Lexington, MA (US)
OSTI ID:
7082828
Report Number(s):
CONF-8707112-
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-34:6; ISSN IETNA
Country of Publication:
United States
Language:
English

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