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Title: Real time Monte Carlo simulation of thin film nucleation in localized-laser chemical vapor deposition

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.342442· OSTI ID:7081933

A real time Monte Carlo simulation is used to model the nucleation and initial stages of thin film growth during localized-laser chemical vapor deposition (LLCVD). This model includes the effects of laser--substrate heating, heterogeneous pyrolytic decomposition of parent molecules on the laser-heated region of the surface, and adatom migration and desorption dynamics. The amount of material deposited as a function of time is obtained over a surface area of 150 x 150 A for various values of the substrate temperature, parent gas pressure, and adsorbate--substrate binding energy. Additional information is obtained about the cluster density, and the role of surface defects and two-atom cluster dynamics on the initial growth rate. The deposition of silicon by heterogeneous pyrolytic decomposition of silane (SiH/sub 4/) is used as a base case for the simulation. Predictions of the initial thin film morphology and its temporal evolution during static laser heating of micron-dimensional regions of the surface are presented. Simulation results indicate that for a given silane pressure and adsorbate--substrate binding energy, there is a critical temperature T/sub c/ such that for laser-induced peak temperatures T/sub p/T/sub c/, nucleation occurs initially in an annulus region centered with respect to the incident laser irradiation. The inclusion of two-atom cluster dynamics in the simulation is shown to increase the value of T/sub c/ and alter the initial morphology for low adsorbate--substrate binding energies.

Research Organization:
Physics Department, Lawrence Livermore National Laboratory, Livermore, California 94550 and Department of Applied Science, University of California, Davis/Livermore, California 94550
OSTI ID:
7081933
Journal Information:
J. Appl. Phys.; (United States), Vol. 64:10
Country of Publication:
United States
Language:
English