Advances in high-resolution image simulation
Conference
·
OSTI ID:7078031
Continuing advances in hardware and software have improved both the speed and the range of computations that can be made to simulate high resolution electron microscope (HREM) images from various structures. Use of image display systems and array processors have made the image simulation procedure much more interactive while laser printers provide a fast high-quality hard copy output. Use of array processors has enabled the rewriting of electron scattering algorithms to include convergence effects (previously only considered after the scattered electron beams had emerged from the specimen) and upper-layer-line effects. With an array processor it is faster to compute effects of spatial and temporal coherence in real space, rather than use approximation solutions derived from series expansion in reciprocal space. With a frame buffer and suitable software the use has the facility to change parameters and view the results of the change almost immediately. Selected images can then be directed to hard copy output, in contrast with batch methods where series of hard copy images are produced and then selected from. Given a microdensitometer for input of experimental images from plates, or a video camera attached to the electron microscope and a frame buffer, split screen comparisons between experimental and computed images are possible, including independent control of image contrast, magnification and orientation. 23 refs., 19 figs., 2 tabs.
- Research Organization:
- Lawrence Berkeley Lab., CA (USA)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 7078031
- Report Number(s):
- LBL-24727; CONF-8804206-1; ON: DE89000569
- Country of Publication:
- United States
- Language:
- English
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