Optical characterization of grating surface emitting semiconductor lasers
- Spectra Diode Laboratories, Inc., 80 Rose Orchard Way, San Jose, California 95134-1356 (USA)
We describe an apparatus for measuring the optical characteristics of grating coupled surface emitting semiconductor lasers. These measurements include far and near field measurements, spectrum, and total power. The far field can be determined with an absolute accuracy of 0.01{degree}. Key words: Semiconductor laser, surface emitter, optical characterization.
- OSTI ID:
- 7066647
- Journal Information:
- Applied Optics; (USA), Journal Name: Applied Optics; (USA) Vol. 29:18; ISSN 0003-6935; ISSN APOPA
- Country of Publication:
- United States
- Language:
- English
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