Precision contour gage

Patent Application · Thu Feb 09 00:00:00 EST 1989

OSTI ID:7065701

Bieg, L F

An apparatus for gaging the contour of a machined part includes a rotary slide assembly and a linear probe assembly supported by the rotary slide assembly. The linear probe assembly is comprised of a suspension arm and a tip assembly including a probe tip for contacting the part. The suspension arm is supported by the rotary slide assembly and includes a slider portion which is capable of sliding upon a complementary rail located on a rotating platform at the top of the rotary slide assembly. By engagement of the slider with the rail, the linear probe assembly is capable of being positioned with respect to the rotary slide assembly. Repositioning is required when a concave part to be measured is substituted for a convex part or vice versa. A kinematic mount supports the entire contour gaging apparatus. A motor drives the rotary slide assembly, and the motor is controlled by a numerical control apparatus. The rotation of the rotary slide assembly is measured by a digital encoder. The probe tip provides a measure of linear displacement of the tip on the surface of the part. As the rotary slide assembly rotates and as the probe tip contact the part, a series of actual data points are generated representing the actual contour of the part. In a numerical controller, the actual contour is compared with a stored ideal contour, and a disparity between the two is calculated. In real-time, the settings of the machining apparatus may be adjusted by the numerical controller, and additional machining operations can continue until the actual contour is as close to the ideal contour as desired. 4 figs.

• Research Organization: Rockwell International Corp., Golden, CO (USA). Rocky Flats Plant
• Sponsoring Organization: DOE/DP
• DOE Contract Number: AC04-76DP03533
• Assignee: Dept. of Energy
• Patent Number(s): PATENTS-US-A7308336
• Application Number: ON: DE90014674; PPN: US 7-308336
• OSTI ID: 7065701
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
CURVILINEAR COORDINATES
MEASURING METHODS
MEASURING INSTRUMENTS
DESIGN
ACCURACY
CARTESIAN COORDINATES
DIGITIZERS
INVENTIONS
MACHINING
POSITIONING
PROBES
REAL TIME SYSTEMS
RESOLUTION
ROTATION
SURFACE PROPERTIES
TEMPERATURE EFFECTS
THREE-DIMENSIONAL CALCULATIONS
TOOLS
VARIATIONS
WEAR
COORDINATES
ELECTRONIC CIRCUITS
MOTION
PULSE CIRCUITS
SIGNAL CONDITIONERS
440800* - Miscellaneous Instrumentation- (1990-)