Stored charge release in cables in low fluence x-ray environments. Topical report Jan--Apr 77
Technical Report
·
OSTI ID:7054921
Stored charge release in cables exposed to low fluence X-radiation has been investigated in the SPI-6000 X-ray simulator. No anomalous response in vacuum has been observed in all cable samples except semirigid cables. However, even for semirigid cables this anomalous behavior disappears if the cable is not bent.
- Research Organization:
- TRW Defense and Space Systems Group, Redondo Beach, CA (USA)
- OSTI ID:
- 7054921
- Report Number(s):
- AD-A-050112
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CABLES
CONDUCTOR DEVICES
CURRENTS
ELECTRIC CABLES
ELECTRIC CHARGES
ELECTRIC CURRENTS
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC RADIATION
EQUIPMENT
IONIZING RADIATIONS
LEAKAGE CURRENT
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
X RADIATION
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CABLES
CONDUCTOR DEVICES
CURRENTS
ELECTRIC CABLES
ELECTRIC CHARGES
ELECTRIC CURRENTS
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC RADIATION
EQUIPMENT
IONIZING RADIATIONS
LEAKAGE CURRENT
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATIONS
X RADIATION