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Title: Ultraviolet-induced transient absorption in potassium dihydrogen phosphate and its influence on frequency conversion

Journal Article · · Journal of the Optical Society of America, Part B: Optical Physics; (United States)
; ; ; ;  [1]
  1. Lawrence Livermore National Laboratory, University of California, P.O. Box 808, Livermore, California 94551 (United States)

The optical properties of an ultraviolet (266-nm) -induced transient absorption in normal and deuterated potassium dihydrogen phosphate crystals are discussed. Our main contribution has been to analyze this effect quantitatively, assess its effect on ultraviolet (UV) frequency-conversion applications, and examine sample variability. As observed previously [Chem. Phys. Lett. [bold 207], 540 (1993)], the transient absorption is broad ([similar to] 200--700 nm) and is suggested to arise from an induced defect state resulting from the promotion of an electron into the conduction band by two-photon absorption. At room temperature we find that the defect absorption decays over a wide variety of time scales, ranging from fractions of a second to several days, depending on the particular sample under study. The decay time does not appear to be correlated with deuteration or chemical impurities. The temperature-dependent decay rate has an Arrhenius behavior with a single activation energy of 0.51 [plus minus] 0.04 eV for all samples studied, and the decay rate appears to be mediated by a diffusional process as previously postulated. We determined the defect absorption cross section at its spectral peak to be 6 [plus minus] 3 [times] 10[sup [minus]18] cm[sup 2]. Based on these and other measurements, we have numerically modeled previously published experimental data on fourth-harmonic frequency conversion of a Nd:YLF laser and found good agreement when the effects of transient absorption are included.

DOE Contract Number:
W-7405-ENG-48
OSTI ID:
7042367
Journal Information:
Journal of the Optical Society of America, Part B: Optical Physics; (United States), Vol. 11:5; ISSN 0740-3224
Country of Publication:
United States
Language:
English