Magneto-optic Kerr ellipticity of epitaxial Co/Cu overlayers and superlattices

Journal Article · Thu Oct 01 04:00:00 EDT 1992 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.46.8195· OSTI ID:7039819

Qiu, Z Q; Pearson, J; Bader, S D ^[1]

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1. Material Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Co/Cu overlayers and superlattices were grown by molecular-beam epitaxy onto Cu(100) and Cu(111) single crystals. Electron diffraction and Auger spectroscopy were used to characterize the film growth and to confirm the epitaxy. Kerr ellipticities at 633 nm also were measured {ital in} {ital situ} both for Co overlayers that were 10--500 A thick, and for various superlattices as a function of the number of bilayers in the film. The ellipticity data initially increase linearly as a function of total Co thickness, in accord with the additivity law expected for magneto-optic signals in the ultrathin limit. In order to simulate the observed thickness trends, however, it was necessary to assign a value to the complex magneto-optic coupling constant that differs from those reported previously.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 7039819
• Journal Information: Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 46:13; ISSN PRBMD; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
COBALT
COPPER
COUPLING CONSTANTS
DIELECTRIC PROPERTIES
ELECTRICAL PROPERTIES
ELEMENTS
EPITAXY
KERR EFFECT
LAYERS
METALS
MOLECULAR BEAM EPITAXY
PHYSICAL PROPERTIES
SUPERLATTICES
TRANSITION ELEMENTS