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U.S. Department of Energy
Office of Scientific and Technical Information

Interfacial structure, properties and design

Conference ·
OSTI ID:7034433
 [1];  [2];  [3]
  1. Oak Ridge National Lab., TN (USA)
  2. Ohio State Univ., Columbus, OH (USA)
  3. General Electric Co., Schenectady, NY (USA)
These proceedings are organized in the order of presentation at the meeting, starting with the recent advances in structural characterization and analysis of internal interface and interphase boundaries. While the crystallographic theory of interfacial line defects had been established rigorously, its general applicability to mixed tilt and twist boundaries was questioned. The insights obtained from theoretical and experimental analyses of elasticity and localized deformation at interfaces relate directly to the intrinsic cohesive strength and intergranular fracture. Effects of processing on the grain boundary structure and chemistry of high T{sub c} ceramic superconductors and the resulting changes in critical currents were established experimentally. A significant advancement was reported in processing and crystal growth techniques, which include the UHV diffusion bonding and MBE techniques for the controlled production of homo- and heterophase interfaces.
OSTI ID:
7034433
Report Number(s):
CONF-8804112--; CNN: DMR8720419; ISBN: 0-931837-92-8
Country of Publication:
United States
Language:
English