Structural study of monolayers of Sb on Ge(111) with different surface reconstructions
- Stanford Electronics Laboratory, Stanford University, Stanford, California 94305 (United States)
- National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
- Department of Physics, Brooklyn College, Brooklyn, New York 11210 (United States)
- Stanford Synchrotron Radiation Laboratory, Stanford, California 94305 (United States)
X-ray standing waves (XSW) and low energy electron diffraction (LEED) have been applied to the structural study of a monolayer of Sb on cleaved Ge(111). Initial Ge(111) surfaces with 2[times]1, [ital c](2[times]8), and 1[times]1 LEED reconstructions have been obtained by preannealing the 2[times]1 room temperature cleavage surfaces. Although in all three cases, the Sb deposition followed by a 600 [degree]C anneal on these different initial reconstructions results in a 2[times]1 or 2[times]1/2[times]2 overlayer LEED geometry, the XSW data indicate large differences in the local Sb bonding structure between them. For the initial 2[times]1 surface, Sb forms Seiwatz chains. Preannealing of the surface causes a decrease in the Sb coherent fraction and an increase of the substrate overlayer distance which is inconsistent with a single site absorption geometry and indicates large disorder of the 1[times]1 surface prior to the Sb deposition.
- OSTI ID:
- 7029384
- Journal Information:
- Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States), Journal Name: Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States) Vol. 12:4; ISSN 0734-2101; ISSN JVTAD6
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360102* -- Metals & Alloys-- Structure & Phase Studies
360602 -- Other Materials-- Structure & Phase Studies
ADSORPTION
ANNEALING
ANTIMONY
CHEMICAL BONDS
COHERENT SCATTERING
DIFFRACTION
ELEMENTS
GERMANIUM
HEAT TREATMENTS
METALS
SCATTERING
SORPTION
SORPTIVE PROPERTIES
STANDING WAVES
SURFACE PROPERTIES
TEMPERATURE RANGE
TEMPERATURE RANGE 0400-1000 K
X-RAY DIFFRACTION