Observation of x-ray speckle by coherent scattering at grazing incidence

Journal Article · Mon Jul 04 04:00:00 EDT 1994 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.73.82· OSTI ID:7025197

Cai, Z H; Lai, B; Yun, W B; McNulty, I ^[1]; Huang, K G ^[2]; Russell, T P ^[3]

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1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
3. IBM Research Division, Almaden Research Center, San Jose, California 95120 (United States)

We have observed x-ray speckle at grazing incidence from gold-coated films of symmetric diblock copolymers of polystyrene (PS) and polymethylmethacrylate (PMMA). The polymer films consisted of micron-sized islands on a uniform surface. Coherent 6-keV photons were selected by monochromatizing and collimating the x-ray beam from a bending magnet synchrotron source. The visibility of the speckle patterns was enhanced with increasing degrees of spatial coherence of the photons. Speckles due to coherent scattering from islands with length scales up to 100 [mu]m were clearly identified.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 7025197
• Journal Information: Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 73:1; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602 -- Other Materials-- Structure & Phase Studies
665100* -- Nuclear Techniques in Condensed Matter Physics -- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BREMSSTRAHLUNG
COHERENT SCATTERING
COPOLYMERS
DIFFRACTION
ELECTROMAGNETIC RADIATION
ESTERS
FILMS
MATERIALS
MEASURING METHODS
MICROSTRUCTURE
ORGANIC COMPOUNDS
ORGANIC POLYMERS
PETROCHEMICALS
PETROLEUM PRODUCTS
PLASTICS
PMMA
POLYACRYLATES
POLYMERS
POLYOLEFINS
POLYSTYRENE
POLYVINYLS
RADIATIONS
RESOLUTION
SCATTERING
SPATIAL RESOLUTION
SURFACE PROPERTIES
SYNCHROTRON RADIATION
SYNTHETIC MATERIALS
X-RAY DIFFRACTION