A Bonse--Hart ultrasmall angle x-ray scattering instrument employing synchrotron and conventional x-ray sources
- Department of Chemistry, State University of New York at Stony Brook, Stony Brook, New York 11794-3400 (United States) Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794 (United States)
- Department of Chemistry, State University of New York at Stony Brook, Stony Brook, New York 11794-3400 (United States)
A Bonse--Hart ultrasmall angle x-ray scattering (USAXS) instrument employing both synchrotron and conventional x-ray sources was constructed. The instrument could be used to determine the structure of systems with inhomogeneity sizes on the order of {similar to}1000 nm. The characteristics of the instrument by using synchrotron and conventional x-ray sources were compared. The use of synchrotron radiation showed much improved features not only in scattered intensity, but also in angular resolution. The scattered intensity was increased by a factor of about 20. Therefore weaker scattering systems could be investigated. By using the synchrotron radiation, the deficiency of the Bonse--Hart camera could be compensated. An angular scan containing {similar to}30 data points in the scattering angle region smaller than {similar to}2 mrad with reasonable signal-to-noise ratio could be completed within 5--10 min for samples with reasonable scattering power. Therefore, kinetic studies could be possible if the half time of structural development in a system is of the order of hours. For static experiments, a conventional x-ray source could be used more conveniently to obtain a scattering curve with similar quality as that by means of synchrotron radiation partially because the channel-cut crystals were not optimized for the synchrotron beam divergence and partially because alignments could be accomplished at a more leisurely pace using the conventional x-ray source.
- DOE Contract Number:
- FG02-86ER45237; FG05-89ER75515
- OSTI ID:
- 7015817
- Journal Information:
- Review of Scientific Instruments; (United States), Vol. 63:9; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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