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Anisotropy of the critical current density in epitaxial YBa sub 2 Cu sub 3 O sub x films

Journal Article · · Physical Review Letters; (USA)
;  [1];  [2]
  1. Siemens AG, Forschungslaboratorien, Postfach 3220, 8520 Erlangen, West Germany (DE)
  2. Physikalisches Institut, Universitaet Erlangen, Erwin Rommel Strasse 1, 8520 Erlangen, West Germany (Germany, F.R.)
The critical current density {ital j}{sub {ital c}}(B,{ital T},{theta}) of epitaxial, {ital c}-axis-oriented YBa{sub 2}Cu{sub 3}O{sub {ital x}} films was measured between 4.2 and 77 K in magnetic fields up to 8 T as a function of the field direction {theta}. Strongly enhanced critical currents are observed when the flux lines are aligned along the CuO planes, but there is also a maximum in {ital j}{sub {ital c}} when the magnetic field is adjusted parallel to the {ital c} axis. We relate these effects to an intrinsic pinning between CuO layers, an anisotropy of the shear modulus {ital c}{sub 66}, and pinning effects of twin boundaries or stacking faults perpendicular to the film plane, respectively.
OSTI ID:
7008612
Journal Information:
Physical Review Letters; (USA), Journal Name: Physical Review Letters; (USA) Vol. 64:4; ISSN PRLTA; ISSN 0031-9007
Country of Publication:
United States
Language:
English