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Electronic structure of ultrathin Fe films on TiO[sub 2](110) studied with soft-x-ray photoelectron spectroscopy and resonant photoemission

Journal Article · · Physical Review, B: Condensed Matter; (United States)
 [1];  [2];  [3];  [2]
  1. Department of Physics and Astronomy and Laboratory for Surface Modification, Rutgers, The State University of New Jersey, Piscataway, New Jersey 08855-0849 (United States) Department of Physics, Tulane University, New Orleans, Louisiana 70118-5698 (United States)
  2. Department of Physics and Astronomy and Laboratory for Surface Modification, Rutgers, The State University of New Jersey, Piscataway, New Jersey 08855-0849 (United States)
  3. Sandia National Laboratories, MS-0344, Albuquerque, New Mexico 87185-0344 (United States)

We report on soft-x-ray photoelectron spectroscopy (SXPS) of a TiO[sub 2](110) surface during deposition of Fe in the monolayer regime. At low fractional monolayer coverages, the adsorbed Fe atoms are oxidized and Ti cations at the interface become reduced due to Fe adsorption. SXPS from shallow core levels and valence bands show that Fe starts to exhibit metallic character at a coverage of approximately 0.7 equivalent monolayers. Two well separated defect states appear in the band gap of TiO[sub 2] at iron coverages well below one monolayer. We use resonant photoemission to obtain information on the partial density of states, and we assign these defect states as being Fe-derived and Ti-derived states, located at the Fe and Ti sites, respectively. We suggest that a position change of oxygen is involved in the bonding of Fe on the TiO[sub 2](110) surface.

DOE Contract Number:
AC04-94AL85000; AC02-76CH00016
OSTI ID:
6999119
Journal Information:
Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 50:19; ISSN PRBMDO; ISSN 0163-1829
Country of Publication:
United States
Language:
English