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Title: Development of NaI(Tl) scintillating films for imaging soft x-rays

Miscellaneous ·
OSTI ID:6978854

Thin film NaI(Tl) scintillators, of areas of up to 130 cm[sup 2], have been fabricated and characterized for use on soft x-ray imaging photomultiplier tubes. Relevant parameters of photon-counting imaging detectors are defined and used to predict the performance of several materials, including CsI(Na), CsI(Tl), CaF[sub 2](Eu), Lu[sub 2](SiO[sub 4])O:Ce, and NaI(Tl), as thin film scintillators on fiber optic substrates. Also, x-ray imaging methodologies are compared. The NaI(Tl) films were vapor-deposited onto quartz and fiber optic substrates using a powder flash deposition technique. When compared to single crystal NaI(Tl), the films were found to have equally high light yield but lower energy resolution. Light yield optimization was studied in detail including the effects of substrate temperature, activator concentration in the evaporant, and boat temperature. Spatial resolution as well as parallax errors are discussed and measured for film thicknesses up to 61 [mu]m. A technique is described that can substantially increase the light collection of high index films on fiber optic disks. The light collection was improved by 20% by coating the disk with potassium silicate before the NaI(Tl) deposition. Large area films, up to 130 cm[sup 2], had a spatial uniformity of response within [+-]1.5% for count rate and [+-]3.5% for light yield, and their spatial resolution exceeded 16.6 lp mm[sup [minus]1] when deposited onto fiber optic substrates. The 8-keV x-ray detection efficiency of the microchannel plate imaging photomultiplier tube coupled to a NaI(Tl) film scintillator is predicted to be 88%. Other uses for the films are also described.

Research Organization:
Virginia Univ., Charlottesville, VA (United States)
OSTI ID:
6978854
Resource Relation:
Other Information: Thesis (Ph.D.)
Country of Publication:
United States
Language:
English